Checkpoint Technologies designs and manufactures Laser Scanning Microscopes and Photon Emission Microscopes for semiconductor device physics analytics/failure analysis. Checkpoint Technologies InfraScan™ LSM/PEM Microscope product line includes laser probing, Dual-Beam LTM-S probing, visible laser probing, waveform acquisition, frequency mapping, photon emission, lock-in TIVA / OBIRCH, SIL technologies, Dual SIL Systems, FemtoSecond Pulsed Laser stimulus, 2-photon LADA, TR-LADA, and pulsed laser probing – to reflect our fundamental commitment to adapting technology to meet customer specific needs within the field of semiconductor failure analysis and fault isolation.