InZiv manufactures high-resolution testing and inspection equipment for today's most advanced microLED and OLEDoS displays. For high-throughput electroluminescent inspection, InZiv offers the R-EL Glide, with fast and repeatable EL inspection. The R-EL Glide features blazing speed, Go-No Go, optical power, and electrical information for each individual chip, all while maintaining high accuracy and using proprietary non-damaging contact technology. For metrology testing, map whole wafers and then analyze individual pixels using nano-PL, electroluminescence (EL), and nano-EL for a comprehensive analysis of the pixel features, including IV, LIV, EQE, angular distribution, and wavelength measurements.