Thursday, May 2025

05:00 PM - 08:00 PM

Room: 220A

Session: OLED Posters

Integrated Multilayer Analysis Platform for OLED Evaporation and Encapsulation Based on TOFSIMS

Description:

TOF-SIMS can expand the range of detectable scenarios and enhance detection capabilities, enabling the construction of a comprehensive detection platform that integrates the entire EVEN process. Specifically, it focuses on the detection of light extraction structures and BPDL.