Thursday, May 2025

05:00 PM - 08:00 PM

Room: 220A

Session: OLED Posters

Quantitative Investigation of High-Temperature Degradation in Organic Light-Emitting Diodes with Charge and Exciton Dynamics

Student

Description:

We analyzed temperature-induced degradation in PhOLEDs using C-V measurements, HOD/EOD devices, and ODE simulations of trPL and trEL. Results showed a greater increase in hole mobility than electron mobility with temperature. Additionally, the TTA rate constant of the host rose sharply compared to other rate constants, making it the key factor in reliability degradation under high-temperature operation.