Thursday, May 2025

05:00 PM - 08:00 PM

Room: 220A

Session: Artificial Intelligence Including Machine Learning for Imaging Posters

Development of an AI Model for Defect Detection Considering Manufacturing Variability

Description:

To evaluate the risk points and levels of display panels caused by manufacturing variations, a numerous number of simulations are required. Traditional reliability assessment method, such as Finite Element Analysis (FEA) are time-consuming for this purpose. Therefore, this study has developed an AI-based model that can predict panel defects, enabling efficient simulations for numerous scattered cases within a short timeframe, serving as a practical alternative to FEA.