Thursday, May 2025
03:10 PM - 03:30 PM
Room: LL21EF
Session: Reliable Oxide TFTs
Challenges of Atomic-Layer-Deposited Oxide Semiconductor Channels Beyond PVD: Material, Devices, and M3D Stacked Structures
Invited
Description:
This study explores ALD-based oxide semiconductors, highlighting in-situ composition control, atomic-scale ordering, and interface engineering. High-mobility (>100 cm²/V·s) IGZO and stable p-type SnO. devices are achieved via optimized ALD processes. We demonstrate monolithic 3D-stacked complementary transistors and propose N?O plasma for addressing mobility-stability trade-offs.