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      1. Home
      2. Exhibitors' Forum
      3. Session: Display Metrology
      Back
      Tuesday
      • 02:00 PM - 02:15 PM

        • (F2.1) Current analytical techniques for displays

          at Exhibit Hall - Showcase Stage

          Speakers: Naohiko Kawasaki

      • 02:15 PM - 02:30 PM

        • (F2.2) Color Measurements in Focus - Maximizing Display Quality with Admesy

          at Exhibit Hall - Showcase Stage

          Speakers: Peter Karp

      • 02:30 PM - 02:45 PM

        • (F2.3) Cutting-edge display measurement technology by TechnoTeam

          at Exhibit Hall - Showcase Stage

          Speakers: Kilian Kirchhoff

      • 02:45 PM - 03:00 PM

        • (F2.4) ELDIM NEW hyper-spectrophotometer

          at Exhibit Hall - Showcase Stage

          Speakers: Thierry Leroux

      • 03:00 PM - 03:15 PM

        • (F2.5) Display Metrology – Can You Get Everything You Need

          at Exhibit Hall - Showcase Stage

          Speakers: Roger Oconnor

      • 03:15 PM - 03:30 PM

        • (F2.6) Automated detection for the presence, size, and location of Foreign Object Debris (FOD) in Multi Configuration Near-Eye Displays

          at Exhibit Hall - Showcase Stage

          Speakers: Ravi Durvasula

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