Guo Kaiyan holds a bachelor's degree from Nankai University and is currently a second-year master's student at the Peking University Shenzhen Graduate School, under the supervision of Professor Zhang Shengdong. Her primary research focuses on pixel circuit design for amorphous silicon (a-Si) TFT-based X-ray flat-panel imagers, with an emphasis on improving key performance metrics such as imaging quality and resolution.